SEMICONDUCTOR / BATTERY
SYSTEMS

SEMICONDUCTOR / BATTERY MANUFACTURING SYSTEMS

SBM381 wafer level inspection & repair machine

Inspection & repair machine / For min. φ0.05mm balls

SBM381 (For Wafers)

This machine does post-ball inspection and repair (rework) for the wafer bumping.
Machine is also capable of repairing the double ball error on the ball mounted wafer.

Features
  • A ball removal mechanism enables repair of double balls and extra balls.
  • A maximum of 3 million balls (min.φ0.05mm) can be inspected.
  • The 2-stage structure simultaneously handles the inspection and repair processes at high throughput.
  • Connecting with the micro ball mounter realizes an in-line configuration.
  • Inspecting faulty locations before/after repair ensures higher mounting yield.
Specifications
Model
SBM381
Applicable product type
Wafer bumping
Wafer level packages
Electronic compornent
Ball size
φ0.05 to φ0.5mm
Inspection/repair range
φ12inch
Wafer size
φ8, φ12 inch (φ4 to 6 inch are optionally available)
Unit dimensions
1440 (L) × 1792 (W) × 1750 (H) mm
Unit weight
1500 kg
INQUIRES

SHIBUYA CORPORATION

Mechatronics Div. S&H Div. Semi-Conductor System Sales Dept.
2-232, Wakamiya, Kanazawa 920-0054
TEL +81(76)262-2201 FAX +81(76)262-2210
E-mail sh-info@shibuya.co.jp